X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1987-11-24
1990-11-27
Fields, Carolyn E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 46, 378 86, 378 87, G01N 23203
Patent
active
049742477
ABSTRACT:
A system and related method are provided for radiographically inspecting an object, located in a radiation path at an inspecting location, using backscattered radiation to obtain a radiographic representation of the object. Radiation, from a source, is transmitted to the selected location. A portion of the transmitted radiation passes through the object and is backscattered by an illuminator to a radiation detecting device. Another portion of the transmitted radiation interacts with and is backscattered by the object to the detecting device. The detecting device generates response signals in response to both portions of the backscattered radiation. The response signals are used to obtain the radiographic representation of the object.
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Fields Carolyn E.
Porta David P.
The Boeing Company
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