Detector system for a scanning electron microscope and a...

Determining defect depth and contour information in wafer...

Device for axially and angularly positioning a beam or the like

Device for contact-free potential measurements

Device for detecting secondary electrons in a scanning electron

Device for measuring crystal orientation and crystal...

Device for measuring the emission of X-rays produced by an...

Dimension measurement system utilizing scanning electron beam

Dimension measuring SEM system, method of evaluating shape...

Direct collection transmission electron microscopy

Double reflection electron emission microscope

Dual detector optics for simultaneous collection of...

Dual electron beam instrument for multi-perspective

Dual-energy electron flooding for neutralization of charged...

Dynamically compensated objective lens-detection device and...

Electric charged particle beam microscopy and electric...

Electron beam apparatus

Electron beam apparatus

Electron beam apparatus

Electron beam apparatus