Sample analyzing apparatus

Sample charging control in charged-particle systems

Sample dimension measuring method and scanning electron...

Sample dimension measuring method and scanning electron...

Sample electrification measurement method and charged...

Sample electrification measurement method and charged...

Sample electrification measurement method and charged...

Sample height regulating method, sample observing method,...

Sample inspection apparatus

Sample observing apparatus and sample observing method

Sample relocation method in charged particle beam apparatus...

Sample shape determination by measurement of surface slope with

Sample-moving automatic analyzing apparatus

Sample-stage for scanning electron microscope

Sampling feedback system

Scan type electron microscope

Scannable-beam microscopes and image stores therefor

Scanning charged particle microscope, and focal distance...

Scanning charged-particle microscope

Scanning electron beam microscope