Rapid defect composition mapping using multiple X-ray...
Raster electron microscope
Reduction of charging effect and carbon deposition caused by...
Reflected electron detector and a scanning electron microscope d
Reflection electron diffractometer and method for observing micr
Remote control of a scanning electron microscope aperture...
Retractable cathodoluminescence detector with high ellipticity a
Rotatable support for selectively aligning a window with the cha
Rule based control for charged-particle beam instrument