Double reflection electron emission microscope

Details Double reflection electron emission microscope Double reflection electron emission microscope

1996-11-22

1999-10-19

Anderson, Bruce

Radiant energy

Inspection of solids or liquids by charged particles

Electron probe type

250397, H01J 37147

Patent

active

059693568

ABSTRACT:
Described is an electron microscope, with which different study modes can be conducted. An electron reflector is mounted in the rear focal plane of the objective lens or in one of its conjugate planes and oriented in such a manner that the primary beam coming from the electron source is focused on the specimen to be studied. The reflector tip can be made of a monocrystal or a polycrystalline material.

REFERENCES:
patent: 3624393 (1971-11-01), Torqueblau
patent: 3714425 (1973-01-01), Someya et al.
patent: 4460827 (1984-07-01), Onoguchi et al.
patent: 4812652 (1989-03-01), Egle et al.
patent: 4988868 (1991-01-01), Gray
patent: 5061850 (1991-10-01), Kelly et al.
patent: 5319207 (1994-06-01), Rose et al.

Affiliated with

Also associated with

Rating

Double reflection electron emission microscope does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Double reflection electron emission microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Double reflection electron emission microscope will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2058892