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Absorption current image apparatus in electron microscope

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Reexamination Certificate

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Accelerating electrostatic lens gun for high-speed electron...

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Reexamination Certificate

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Active cantilever for nanomachining and metrology

Radiant energy – Inspection of solids or liquids by charged particles
Reexamination Certificate

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Actuator and transducer

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
Reexamination Certificate

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Additive composition of defocusing images in an electron microsc

Radiant energy – Inspection of solids or liquids by charged particles – Electron microscope type
Patent

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Addressable transmission electron microscope grid

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
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Adhesion cooling for an ion implantation system

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
Patent

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Adjustable collimator

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
Patent

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Adjustable compensating device for radiographic apparatus

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
Patent

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Advanced process control framework using two-dimensional...

Radiant energy – Inspection of solids or liquids by charged particles – Electron microscope type
Reexamination Certificate

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AFM-based lithography metrology tool

Radiant energy – Inspection of solids or liquids by charged particles
Reexamination Certificate

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Alpha particle x-ray energy analysis system

Radiant energy – Inspection of solids or liquids by charged particles
Patent

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Alpha-ray radiation source photographing device

Radiant energy – Inspection of solids or liquids by charged particles
Patent

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Analysis of CD-SEM signal to detect scummed/closed contact...

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Reexamination Certificate

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Analysis of semiconductor surfaces by secondary ion mass spectro

Radiant energy – Inspection of solids or liquids by charged particles – Positive ion probe or microscope type
Patent

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Analysis of semiconductor surfaces by secondary ion mass...

Radiant energy – Inspection of solids or liquids by charged particles – Positive ion probe or microscope type
Reexamination Certificate

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Analysis of semiconductor surfaces by secondary ion mass...

Radiant energy – Inspection of solids or liquids by charged particles – Positive ion probe or microscope type
Reexamination Certificate

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Analysis of semiconductor surfaces by secondary ion mass...

Radiant energy – Inspection of solids or liquids by charged particles – Positive ion probe or microscope type
Reexamination Certificate

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Analysis of semiconductor surfaces by secondary ion mass...

Radiant energy – Inspection of solids or liquids by charged particles – Positive ion probe or microscope type
Reexamination Certificate

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Analysis of semiconductor surfaces by secondary ion mass...

Radiant energy – Inspection of solids or liquids by charged particles – Positive ion probe or microscope type
Reexamination Certificate

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