Testing embedded circuits with the aid of a separate supply...

Testing embedded memories in an integrated circuit

Testing embedded memory in integrated circuits such as...

Testing embedded memory in integrated circuits such as...

Testing embedded RAM blocks by employing RAM scan techniques

Testing error correcting code feature in computers that do...

Testing frequency hopping devices

Testing functional boundary logic at asynchronous clock...

Testing hard-wired IP interface signals using a soft scan chain

Testing hardware components to detect hardware failures

Testing high I/O integrated circuits on a low I/O tester

Testing IC functional and test circuitry having separate...

Testing implementation suitable for built-in self-repair...

Testing IO timing in a delay locked system using separate...

Testing logic and embedded memory in parallel

Testing logic associated with numerous memory cells in the word

Testing mechanism in a semiconductor integrated circuit device u

Testing memory units in a digital circuit

Testing method and apparatus assuring semiconductor device...

Testing method and apparatus for first-in first-out memories