Testing method and apparatus for first-in first-out memories

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

714 48, 714 42, G01R 3128

Patent

active

061088021

ABSTRACT:
A variety of FIFOs, including single and dual port, RAM-type and/or having a ring-type addressing mechanism, are tested by causing the FIFOs to execute a test method comprised of a series of steps. Upon execution, the steps cause the FIFO to manifest a variety of faults. This test method manifests faults by monitoring the outcome of operations and the values of particular flags indicative of normal FIFO operation.

REFERENCES:
patent: 5291449 (1994-03-01), Dehara
patent: 5381419 (1995-01-01), Zorian
patent: 5473651 (1995-12-01), Guzinski et al.
patent: 5513318 (1996-04-01), van de Goor et al.
patent: 5784382 (1998-07-01), Byers et al.
patent: 5935263 (1999-08-01), Keeth et al.
patent: 5978935 (1999-11-01), Kim et al.
Fenstermaker, et al. A Low-Power Generator-Based FIFO using Ring Pointers and Current-Mode Sensing, IEEE, 1993.
van de Goor, et al. Fault Models and Tests Specific for FIFO Functionality, IEEE, 1994.
van de Goor, et al. Functional tests for Ring-Address SRAM-type FIFOs, IEEE, 1994.
Standard Cells and Building Blocks, 1.25P.mu. CMOS Library, AT & T (2d. Ed. 1989), pp. 8-6 to 8-10.
CMOS/BiCMOS Data Book, Cypress Semiconductor (Mar. 1, 1992), Chapter 5, pages for devices commercially designated as CY7C432 and CY7C433.
CMOS/BiCMOS Data Book, Cypress Semiconductor (Mar. 1, 1992), Chapter 5, pages for devices commercially designated as CY7C401/CY7C403/CY7C402/CY7C404.
CMOS/BiCMOS Data Book, Cypress Semiconductor (Mar. 1, 1992), Chapter 5, pages for devices commercially designated as CY7C408A and CY7C409A.
CMOS/BiCMOS Data Book, Cypress Semiconductor (Mar. 1, 1992), Chapter 5, pages for devices commercially designated as CY7C420, CY7C421, CY7C424, CY7C425, CY7C428, CY7C429.
CMOS/BiCMOS Data Book, Cypress Semiconductor (Mar. 1, 1992), Chapter 5, pages for devices commercially designated as CY7C431 and CY7C433.
van de Goor et al., "Fault Models and Tests for Ring Address Type FIFOs."

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Testing method and apparatus for first-in first-out memories does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Testing method and apparatus for first-in first-out memories, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testing method and apparatus for first-in first-out memories will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-595349

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.