Testing embedded memory in integrated circuits such as...

Details Testing embedded memory in integrated circuits such as... Testing embedded memory in integrated circuits such as...

2008-05-20

2008-05-20

Tu, Christine T (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S724000

Reexamination Certificate

active

10978899

ABSTRACT:
Method and apparatus for the testing of embedded memories in integrated circuits such as programmable logic devices are disclosed. In conjunction with a partial BIST engine, an external tester provides the embedded memories with test vectors. The on-chip partial BIST engine retrieves the test vectors from the embedded memories and compares them to corresponding expected test vectors supplied by the external tester. Based upon the comparison, the on-chip partial BIST engine forms comparison results indicating whether the retrieved test vectors differ from the corresponding expected test vectors. For programmable logic devices, a full BIST engine may be configured in the integrated circuit for generating the test vectors on chip.

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