LandOfFree - US Patents - Listing for Error detection/correction and fault detection/recovery,Pulse or data error handling

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Testing and burn-in of IC chips using radio frequency transmissi

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Patent

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Testing and burn-in of IC chips using radio frequency...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing and repair methodology for memories having redundancy

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Testing apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing apparatus and a testing method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Testing apparatus and testing method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Testing apparatus and testing method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Testing apparatus and testing method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing apparatus and testing method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Testing apparatus and testing method for an integrated...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing apparatus and testing method for an integrated...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing board for semiconductor memory, method of testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Testing board for semiconductor memory, method of testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Testing circuit split between tiers of through silicon...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Testing CMOS CAM with redundancy

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Testing content addressable static memories

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Testing content-addressable memories

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Testing data packets

Error detection/correction and fault detection/recovery – Pulse or data error handling – Transmission facility testing

Reexamination Certificate

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Testing device, testing method, computer program product,...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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