Testing board for semiconductor memory, method of testing...

Details Testing board for semiconductor memory, method of testing... Testing board for semiconductor memory, method of testing...

2007-05-29

2007-05-29

Ton, David (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S718000

Reexamination Certificate

active

10949192

ABSTRACT:
A testing circuit using ALPG is mounted in a testing board in which sockets for mounting semiconductor memories as devices to be tested in the board is mounted and a volatile memory for storing a data table for generating a random pattern is provided in the testing circuit so that a test using a test pattern having no regularity is performed using the data table in addition to a test using a test pattern having regularity generated by the ALPG.

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patent: WO98/47152 (1998-10-01), None

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