Testing apparatus

Details Testing apparatus Testing apparatus

2007-09-25

2007-09-25

Chung, Phung My (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S707000, C714S744000, C702S117000

Reexamination Certificate

active

11048632

ABSTRACT:
A testing apparatus including a plurality of testing module slots to which different types of testing modules for testing a device under test are optionally mounted, includes an operation order holding unit for holding information indicating that a test operation by a first testing module should be performed before a test operation by a second testing module, a trigger return signal receiving unit for receiving a trigger return signal from the first testing module, the trigger return signal indicating that the first testing module has completed the test operation thereof, when the test operation of the first testing module has been completed, and a trigger signal supplying unit for supplying a trigger signal to the second testing module, the trigger signal indicating that the second testing module should start the test operation thereof, when the trigger return signal receiving unit receives the trigger return signal.

REFERENCES:
patent: 4707834 (1987-11-01), Frisch et al.
patent: 6028439 (2000-02-01), Arkin et al.
patent: 2004/0177303 (2004-09-01), Miura
patent: 2005/0114550 (2005-05-01), Kushnik
patent: 2005/0240852 (2005-10-01), Inaba et al.
patent: 2195029 (1988-03-01), None
patent: 10-239396 (1998-09-01), None
patent: 2001-174526 (2001-06-01), None
patent: 2002-528706 (2002-09-01), None
patent: 2003-217299 (2003-07-01), None
International Search Report for PCT/JP2004/018069 mailed on Mar. 17, 2005, 3 pages.
Japanese Office Action “Notification of Reasons for Refusal” issued in Japanese Application No. 2006-526016 mailed on Feb. 6, 2007 and English translation thereof, 6 pages.

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