Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2008-03-12
2010-06-01
Tabone, Jr., John J (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S710000, C714S719000, C714S743000, C365S200000, C365S201000, C324S765010
Reexamination Certificate
active
07730371
ABSTRACT:
There is provided a test apparatus for testing a memory under test that is addressable by the number of pulses of an address signal supplied thereto. The test apparatus includes a pattern generating section that generates writing data to be written into the memory under test, a first address generating section having an address information storing section that stores thereon address information indicating an address of the memory under test to which the writing data is to be written, and a waveform shaping section that generates an address signal by outputting one or more pulses at a predetermined time interval during a time period determined in accordance with the address information stored on the address information storing section.
REFERENCES:
patent: 4797886 (1989-01-01), Imada
patent: 4998025 (1991-03-01), Watanabe
patent: 5682390 (1997-10-01), Housako et al.
patent: 5796748 (1998-08-01), Housako et al.
patent: 5831989 (1998-11-01), Fujisaki
patent: 5854796 (1998-12-01), Sato
patent: 6021515 (2000-02-01), Shimura
patent: 6425095 (2002-07-01), Yasui
patent: 6502216 (2002-12-01), Takano
patent: 6504773 (2003-01-01), Kobayashi
patent: 6513138 (2003-01-01), Ohsawa
patent: 6523143 (2003-02-01), Kobayashi
patent: 6571353 (2003-05-01), Sato
patent: 6836863 (2004-12-01), Tabata et al.
patent: 6851078 (2005-02-01), Takano
patent: 6880117 (2005-04-01), Lin et al.
patent: 7079971 (2006-07-01), Fukuda
patent: 7103493 (2006-09-01), Kang et al.
patent: 7294998 (2007-11-01), Chiba
patent: 2002/0138799 (2002-09-01), Takano
patent: 2005/0043912 (2005-02-01), Kang et al.
patent: 2000-311500 (2000-11-01), None
patent: 2005-182866 (2005-07-01), None
Fujibe Tasuku
Hashimoto Jun
Watanabe Naoyoshi
Advantest Corporation
Osha • Liang LLP
Tabone, Jr. John J
LandOfFree
Testing device, testing method, computer program product,... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Testing device, testing method, computer program product,..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testing device, testing method, computer program product,... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4178108