Testing and repair methodology for memories having redundancy

Details Testing and repair methodology for memories having redundancy Testing and repair methodology for memories having redundancy

2007-05-22

2007-05-22

DeCady, Albert (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S733000, C714S710000, C365S201000

Reexamination Certificate

active

10708342

ABSTRACT:
A method of testing and repairing an integrated circuit having a total number of fuses for effecting repair of the integrated circuit. The method including: testing a memory array with a set of tests and reserving a first number of the total number of fuses for use in repairing the memory array based on results of the first set of tests; and shmoo testing the memory array by incrementing, decrementing or incrementing and decrementing values of a test parameter until a minimum or maximum value of the test parameter is reached that utilizes a second number of the total number of fuses for use in repairing the memory array to operate at the minimum or maximum value of the test parameter.

REFERENCES:
patent: 5471431 (1995-11-01), McClure
patent: 5579266 (1996-11-01), Tahara
patent: 5961653 (1999-10-01), Kalter et al.
patent: 6067262 (2000-05-01), Irrinki et al.
patent: 6230292 (2001-05-01), Duesman et al.
patent: 6330697 (2001-12-01), Clinton et al.
patent: 6367042 (2002-04-01), Phan et al.
patent: 6768694 (2004-07-01), Anand et al.
patent: 6795788 (2004-09-01), Thatcher et al.
patent: 6870388 (2005-03-01), Weller

Affiliated with

Also associated with

Rating

Testing and repair methodology for memories having redundancy does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Testing and repair methodology for memories having redundancy, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testing and repair methodology for memories having redundancy will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3727026