Testing apparatus and testing method

Details Testing apparatus and testing method Testing apparatus and testing method

2006-09-01

2008-10-21

Chung, Phung M (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S736000, C714S738000

Reexamination Certificate

active

07441166

ABSTRACT:
There is provided a testing apparatus including: a pattern generator that generates an address signal and a data signal to be supplied to a plurality of memories under test and an expectation signal; a plurality of logic comparators that generate fail data when an output signal output from the plurality of memories under test and the expectation signal are not identical with each other; a plurality of fail memories that store the fail data generated from the plurality of logic comparators; a plurality of memory controllers that generate bad address information showing a bad address in the memory under test based on the fail data stored on the plurality of fail memories; a plurality of universal buffer memories that store the bad address information generated from the plurality of memory controllers; and a plurality of bad information writing sections that concurrently write bad information into the bad address in the plurality of memories under test, which is shown by the bad address information stored on the plurality of universal buffer memories.

REFERENCES:
patent: 5070297 (1991-12-01), Kwon et al.
patent: 5610925 (1997-03-01), Takahashi
patent: 5790559 (1998-08-01), Sato
patent: 7036053 (2006-04-01), Zumkehr et al.
patent: 7137055 (2006-11-01), Hirano et al.
patent: 2007/0162826 (2007-07-01), Major et al.
patent: WO-97/04328 (1997-02-01), None
patent: WO-00/52488 (2000-09-01), None
patent: WO-02/33708 (2002-04-01), None
patent: WO-03/052767 (2003-06-01), None
International Search Report issued in International Application No. PCT/JP2005/005171 mailed on Jun. 28, 2005 and English translation thereof, 4 pages.

Affiliated with

Also associated with

Rating

Testing apparatus and testing method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Testing apparatus and testing method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testing apparatus and testing method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4015485