Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2007-05-15
2007-05-15
Decady, Albert (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S718000, C714S720000, C365S049130, C365S201000
Reexamination Certificate
active
10679266
ABSTRACT:
A method for testing an CMOS ternary content addressable memory (TCAM) device includes a match line test to identify stuck match lines, a pull down test to identify weak pull downs (from the match line to ground), and a row-by-row match test. During the row-by-row match test a failed cell can be repaired or the row associated with the failed cell can be disabled. A failed cell or its associated row can also be repaired or disabled, respectively, after the test. Additionally, individual CAM cells which are identified as being defective can be further tested to identify which component of the CAM cell failed.
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De'cady Albert
Dickstein & Shapiro LLP
Trimmings John P.
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