Testing apparatus and testing method

Details Testing apparatus and testing method Testing apparatus and testing method

2008-04-22

2008-04-22

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S005110, C714S006130, C714S042000, C714S054000, C714S721000, C714S742000, C714S744000, C714S745000, C714S814000, C714S815000, C365S185010, C365S185030, C365S201000

Reexamination Certificate

active

11298562

ABSTRACT:
A testing apparatus for testing a memory-under-test includes a writing section for writing preset test data into each page of said memory-under-test to test said memory-under-test and a fail memory unit for storing the test result of said memory-under-test. The fail memory unit includes a write time measuring section for measuring a write time required for writing said test data per each of said pages, an integrating section for integrating said write time across a plurality of said pages set in advance, and a judging section for judging whether or not said memory-under-test is defect-free by comparing a value integrated by said integrating section with an expected value set in advance. The integrating section further integrates said write time per page group having said predetermined number of pages. The judging section further judges whether or not said page group is defect-free based on an integral value of said write time per said page group.

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Japanese PCT/JP2006/323470, Feb. 6, 2007, a translation of Mitsubishi Electric, JP 01-120000 above.
Japanese PCT International Search Report for PCT/JP2006/323470, dated Feb. 6, 2007, and English translation thereof, 16 pages.

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