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System and method for testing electronic device performance

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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System and method for testing electronic devices on a microchip

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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System and method for testing high pin count electronic...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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System and method for testing high speed VLSI devices using...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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System and method for testing integrated circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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System and method for testing integrated circuits at...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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System and method for testing integrated memories

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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System and method for testing memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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System and method for testing memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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System and method for testing memory arrays

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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System and method for testing memory at full bandwidth

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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System and method for testing memory blocks in an SOC design

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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System and method for testing memory systems

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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System and method for testing memory while an operating...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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System and method for testing memory while an operating...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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System and method for testing multiple packet data transmitters

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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System and method for testing of embedded processor

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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System and method for testing on-chip modules and the...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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System and method for testing operational transmissions of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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System and method for testing signal interconnections using...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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