System and method for testing electronic device performance

Details System and method for testing electronic device performance System and method for testing electronic device performance

2006-12-26

2006-12-26

Ton, David (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S046000

Reexamination Certificate

active

07155653

ABSTRACT:
A system for testing electronic device performance includes a test device and at least one target device coupled to the test. The test device determines when at least one test command is incompatible with the at least one target device and modifies the at least one incompatible test command such that the at least one incompatible test command is compatible with the at least one target device. The test device presents the at least one compatible test command to the at least one target device and determines a response of the at least one target device to the respective at least one compatible test command.

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patent: 6810364 (2004-10-01), Conan et al.

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