Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2005-03-03
2009-12-15
Ellis, Kevin L (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S722000
Reexamination Certificate
active
07634696
ABSTRACT:
In some embodiments, a method for testing a memory having a plurality of bits is provided and includes initializing each value in a first register to zero. Next, each value in a second register is initialized to one. Further, each bit in the memory is initialized to zero. A logical OR operation is applied to each bit in the memory with a bit value as the first operand and a corresponding register value in the first register as the second operand. Additionally, the method includes initializing each bit in the memory to one. Also, a logical AND operation is applied to each bit in the memory with the bit value as the first operand and a corresponding register value as the second operand.
REFERENCES:
patent: 4368532 (1983-01-01), Imazeki et al.
patent: 4686456 (1987-08-01), Furuyama et al.
patent: 4715034 (1987-12-01), Jacobson
patent: 4782486 (1988-11-01), Lipcon et al.
patent: 4873705 (1989-10-01), Johnson
patent: 5446741 (1995-08-01), Boldt et al.
patent: 6219286 (2001-04-01), Fuchigami et al.
patent: 6532556 (2003-03-01), Wong et al.
patent: 6550023 (2003-04-01), Brauch et al.
patent: 6728911 (2004-04-01), Maynard et al.
patent: 7415640 (2008-08-01), Zorian et al.
“Memory Testing,” Memory Testing.1.
“Memory Testing,” DS&VLSI Testing, pp. 1-28.
“Chapter 9 Memory Testing,” Cheng-Wen Wu, Lab for Reliable Computing (LaRC), EE, NTHU, 2002.
“Lecture 27 Memory Delay-Fault Built-In Self-Testing,” Agrawal & Bushnell, VLSI Test: Lecture 27 2001.
“Memory Testing,” Cheng-Wen Wu, Lab for Reliable Computing (LaRC), EE, NTHU, 2002 .
Ellis Kevin L
Nguyen Steve
Sigmatel, Inc.
Toler Law Group
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