System and method for testing integrated circuits at...

Details System and method for testing integrated circuits at... System and method for testing integrated circuits at...

2007-06-05

2007-06-05

Tu, Christine T. (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S798000

Reexamination Certificate

active

10982275

ABSTRACT:
A system tests an integrated circuit at operational speed. The system includes a high frequency clock converter that receives test clock signals at a speed lower than operational speed of the integrated circuit to be tested. The high frequency clock converter generates test clock signals for operational speed testing of the integrated circuit.

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