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Scan verification for a scan-chain device under test

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Scan-based testing of devices implementing a test clock...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Scan-bypass architecture without additional external latches

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Scan-enabled method and system for testing a system-on-chip

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Scan-path circuit, logic circuit including the same, and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Scan-path flip-flop circuit for integrated circuit memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Scanable latch circuit and method for providing a scan...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Scanable R-S glitch latch for dynamic circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Scannable state element architecture for digital circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Scanned memory testing of multi-port memory arrays

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Scanning a protocol signal into an IC for performing a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Scanning device and method for hierarchically forming a scan pat

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Scanning memory device and error correction method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
Patent

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Scanning reassigned data storage locations

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Scheduling of transactions in system-level test program...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Testing of error-check system
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Scheduling the concurrent testing of multiple cores embedded...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Scheme for eliminating the effects of duty cycle asymmetry...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error detection for synchronization control
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Scheme for error control on ATM adaptation layer in ATM networks

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Patent

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Scheme for the reduction of extra standby current induced by...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Scrambler circuit, encoding device, encoding method and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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