Scan verification for a scan-chain device under test
Scan-based testing of devices implementing a test clock...
Scan-bypass architecture without additional external latches
Scan-enabled method and system for testing a system-on-chip
Scan-path circuit, logic circuit including the same, and...
Scan-path flip-flop circuit for integrated circuit memory
Scanable latch circuit and method for providing a scan...
Scanable R-S glitch latch for dynamic circuits
Scannable state element architecture for digital circuits
Scanned memory testing of multi-port memory arrays
Scanning a protocol signal into an IC for performing a...
Scanning device and method for hierarchically forming a scan pat
Scanning memory device and error correction method
Scanning reassigned data storage locations
Scheduling of transactions in system-level test program...
Scheduling the concurrent testing of multiple cores embedded...
Scheme for eliminating the effects of duty cycle asymmetry...
Scheme for error control on ATM adaptation layer in ATM networks
Scheme for the reduction of extra standby current induced by...
Scrambler circuit, encoding device, encoding method and...