Semiconductor memory device and parallel bit test method...

Semiconductor memory device and redundant address selection meth

Semiconductor memory device and refresh period controlling...

Semiconductor memory device and semiconductor memory device...

Semiconductor memory device and signal processing system

Semiconductor memory device and signal processing system

Semiconductor memory device and test method of the same

Semiconductor memory device and test pattern data generating...

Semiconductor memory device and testing method of the same

Semiconductor memory device and testing system and testing...

Semiconductor memory device capable of arbitrarily setting...

Semiconductor memory device capable of changing ECC code length

Semiconductor memory device capable of fast testing without exte

Semiconductor memory device capable of testing memory cells...

Semiconductor memory device equipped with error correction...

Semiconductor memory device equipped with error correction...

Semiconductor memory device equipped with error correction...

Semiconductor memory device having a test control circuit

Semiconductor memory device having an ECC circuit

Semiconductor memory device having burn-in test mode and...