Semiconductor memory device and semiconductor memory device...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment

Reexamination Certificate

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C714S727000

Reexamination Certificate

active

08006143

ABSTRACT:
A semiconductor memory device having a first memory block used when it is determined to be used in a first case, a second memory block used as an alternative of the first memory blocks when it is determined to be used in a second case, a write section that writes determination data into the first memory block for making a determination at the time of the determination and writes the determination data into the second memory block and a read section that reads the determination data written into the first memory block by the write section for making a determination at the time of the determination and reads the determination data written into the second memory block by the write section.

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patent: 6420896 (2002-07-01), Maeno
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patent: 6532181 (2003-03-01), Saito et al.
patent: 6894943 (2005-05-01), Suzuki et al.
patent: 7071704 (2006-07-01), Crowell
patent: 2003/0117872 (2003-06-01), Akamatsu
patent: 6-103794 (1994-04-01), None
patent: 8-161897 (1996-06-01), None
patent: 2002-42484 (2002-02-01), None
patent: 2002-269993 (2002-09-01), None
International Preliminary Report on Patentability, mailed Mar. 17, 2009, in corresponding International Application No. PCT/JP2006/317421 (5 pp.).

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