Semiconductor memory device equipped with error correction...

Details Semiconductor memory device equipped with error correction... Semiconductor memory device equipped with error correction...

2005-05-17

2008-09-16

Chaudry, Mujtaba K. (Department: 2112)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Error/fault detection technique

C714S804000

Reexamination Certificate

active

07426683

ABSTRACT:
The objective of the invention is to provide a type of semiconductor memory device equipped with an error correction circuit200characterized by the fact that it can perform correction of errors in stored data without increasing the circuit size and power consumption, and without decreasing operating speed. An error correction code EC corresponds to data stored in sub-memory120separate from main data stored in main memory110.In read mode, the main data and error correction code are read from the main memory and sub-memory, respectively. On the basis of these data, the error correction code is generated for correcting errors in the read data. Error correction circuit300corrects errors in the main data. By storing the error correction code in a sub-memory different from the main memory and selecting the appropriate layout of the main memory and sub-memory, it is possible to increase the reading speed of the error correction code and to suppress time delays caused by error correction.

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