Semiconductor memory device and test pattern data generating...

Details Semiconductor memory device and test pattern data generating... Semiconductor memory device and test pattern data generating...

2007-08-14

2007-08-14

Britt, Cynthia (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S720000

Reexamination Certificate

active

10954870

ABSTRACT:
A semiconductor memory device includes a mode setting register for generating a parallel bit test signal and a code according to an externally applied mode setting register code in response to a mode setting command; a data input circuit for receiving and outputting at least one bit of externally applied data in response to a write command; and a test pattern data generating circuit for receiving the parallel bit test signal and a predetermined bit from the code to generate a test pattern data in response to the at least one bit of externally applied data received from the data input circuit.

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