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Semiconductor device improving error correction processing rate

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Semiconductor device including macros and its testing method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor device including test-facilitating circuit...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor device inspection apparatus and semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor device provided with a boundary-scan test circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor device test apparatus and method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
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Semiconductor device test method for optimizing test time

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor device tested using minimum pins and methods...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor device tester for measuring skew between...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Skew detection correction
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Semiconductor device testing

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor device testing apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor device testing apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Semiconductor device testing apparatus and method for testing me

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Semiconductor device testing apparatus and signal output...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor device testing apparatus capable of high speed tes

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Semiconductor device testing apparatus, system, and method...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor device to improve data retention...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor device to improve data retention...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor device with boundary scanning circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor device with logic rewriting and security...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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