Semiconductor device test apparatus and method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment

Reexamination Certificate

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C714S718000, C365S200000, C365S201000

Reexamination Certificate

active

07613960

ABSTRACT:
There is provided a semiconductor test apparatus which uses a test processor to apply a test signal to a DUT having a semiconductor device within it to determine whether the memory is acceptable or not on the basis of a response signal, and uses a repair analysis computing unit to analyze the result of the test to determine how to replace a defective cell of the memory with a spare line. The repair analysis computing unit includes a fail memory which stores test results and a general-purpose repair analysis part which analyzes the test results in accordance with an MRA program and inserts and executes a user function of a user analysis program between units of analysis processing.

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Stallman R., translated by Toru Takizawa, “GNU Emacs 19 Manual”, Addison Wesley Publishers Japan Kabushiki Kaisha, Oct. 31, 1997, pp. 337-338 (with its English translation).
Stallman, R., translated by Toru Takizawa, “GNU Emacs 19 Manual”, Addison Wesley Publishers Japan Kabushiki Kaisha, Oct. 31, 1997, pp. 337-338 (with its English translation).

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