Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2008-01-01
2008-01-01
Peugh, Brian R. (Department: 2187)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S733000, C714S763000, C714S801000, C711S106000
Reexamination Certificate
active
11078506
ABSTRACT:
A semiconductor device able to improve data retaining characteristics and decrease power consumption, further able to realize more unrestricted system without increasing excessive circuits, and having the following: an ALPG receiving a start signal and a mode selection signal to generate commands and addresses with respect to a DRAM circuit with the predetermined patterns in accordance with modes, and outputting an ending signal when ending a pattern generating processing in each of modes; an ECC circuit receiving a start signal and a mode selection signal indicating a parity generation mode to generate a parity based on data read from the DRAM circuit, receiving the start signal and a mode selection signal indicating an error correction mode to perform an error correction with respect to data read from the DRAM circuit based on the parity generated in the parity generation mode and outputting data after correcting; and an interface circuit.
REFERENCES:
patent: 6381715 (2002-04-01), Bauman et al.
patent: 2002/0018389 (2002-02-01), Ito et al.
patent: 2002/0156967 (2002-10-01), Okuda
patent: 2003/0106010 (2003-06-01), Fujioka et al.
patent: 2004/0017703 (2004-01-01), Shinohara
patent: 2002-056671 (2002-02-01), None
Yamauchi et al “A Curcuit Technology for a Self- Refresh 16Mb DRAM with Less than 0.5uA/MB Data-Retention Current”, Nov. 1995, IEEE Journal of Solid-State Circuits, vol. 30, No. 11.
Arakawa Tomofumi
Inoue Kazutoshi
Kodama Hiroaki
Detschel Fred W
Kananen Ronald P.
Peugh Brian R.
Rader & Fishman & Grauer, PLLC
LandOfFree
Semiconductor device to improve data retention... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor device to improve data retention..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device to improve data retention... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3956088