IC measuring device

Details IC measuring device IC measuring device

2005-05-10

2005-05-10

Lamarre, Guy J. (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Skew detection correction

Reexamination Certificate

active

06892333

ABSTRACT:
An IC measuring device constituted by a first timing generator (TG21) for outputting a pair of judgment strobe pulses (S21); a first edge detector (E21) for detecting the states of a data strobe (DCK2) at two time points within one test cycle on the basis of the pair of judgment strobe pulses (S21); a second timing generator (TG22) for outputting a pair of judgment strobe pulses (S22); a second edge detector (E22) for detecting the states of data at two time points within one test cycle on the basis of the pair of judgment strobe pulses (S22); and a judgment section (J22) for determining acceptance/rejection of the timing of the data with reference to the data strobe on the basis of the states of the data and the states of the data strobe.

REFERENCES:
patent: 5835506 (1998-11-01), Kuglin
patent: 6016565 (2000-01-01), Miura
patent: 101 01 899 (2001-11-01), None

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