Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2005-08-23
2005-08-23
Sheikh, Ayaz (Department: 2131)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S718000, C714S719000, C714S726000, C365S200000, C365S201000, C365S189011, C365S230010, C365S230030, C324S765010, C324S800000, C324S800000
Reexamination Certificate
active
06934895
ABSTRACT:
An I/O compression circuit for a semiconductor memory device operates in a same data compress mode to transmit identical data to all compressed data buses and a different data compress mode to transmit different data to adjacent compressed data buses.
REFERENCES:
patent: 5864510 (1999-01-01), Nakaoka
patent: 6009026 (1999-12-01), Tamlyn et al.
patent: 6357027 (2002-03-01), Frankowsky
patent: 6452845 (2002-09-01), Merritt
patent: 7-85699 (1995-03-01), None
Notice of Rejection from Korean Intellectual Property Office dated Dec. 8, 2003 (4 pages).
Hynix / Semiconductor Inc.
Marshall & Gerstein & Borun LLP
Sheikh Ayaz
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