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Semiconductor testing apparatus and method of testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor testing apparatus for testing semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor testing apparatus for testing semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor testing equipment, testing method for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor wiring substrate, semiconductor device, method...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Sensor fault detection, isolation and accommodation

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Separately controlled scan paths of functional registers...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Sequence-based verification method and system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Sequential pattern extracting apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Sequential scan based techniques to test interface between...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Sequential scan technique for testing integrated circuits...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Sequential scan technique providing enhanced fault coverage...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Sequential scan technique providing enhanced fault coverage...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Sequential signals selecting mode and stopping transfers of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Sequential test pattern generation using clock-control...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Sequential test pattern generation using combinational...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Sequential tester for longest prefix search engines

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Serial burn-in monitor

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Serial data I/O on JTAG TCK with TMS clocking

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Serial data input/output method and apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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