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Generator/compactor scan circuit low power adapter

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Generator/compactor scan circuit low power adapter with counter

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Generic debug external connection (GDXC) for high...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Global transition scan based AC method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Globally distributed scan blocks

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Graphical editor for defining memory test sequences

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Graphical user interface for testability operation

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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