LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application,Diffraction, reflection, or scattering analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Estimating strengths of wooden supports by detecting...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Eucentric motion system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Examination method and apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Examination method for the evaluation of location-dependent spec

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Examination of material samples

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Explosives detection using resonance fluorescence of bremsstrahl

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Extreme ultraviolet soft x-ray projection lithographic...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Fan and pencil beams from a common source for x-ray inspection

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Film thickness measuring and film forming method

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Filter method for an x-ray system, and device for carrying out s

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Fitting of X-ray scattering data using evolutionary algorithms

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Fixture for supporting and aligning a sample to be analyzed in a

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Foreign object detection

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Gamma ray flaw detection system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Gamma-gamma resonance in activation analysis, and particularly,

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Gated transmission and scatter detection for x-ray imaging

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Goniometer

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Goniometer in an x-ray diffraction device

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Goniometric device particularly for X-ray or neutron diffractome