Gamma ray flaw detection system

Details Gamma ray flaw detection system Gamma ray flaw detection system

1987-05-01

1989-09-26

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 58, G01N 2320

Patent

active

048706698

ABSTRACT:
A collimated beam of gamma radiation is applied to a test object under non-destructive examination to produce a scattered gamma radiation field within which detectors are positioned to provide radiation energy level data of the field. Such measurement data is processed by comparison with reference data from a flawless object to provide differential scatter gamma spectra. The differential spectra are transformed by spatial/energy data processing to extract accurate location and size data with respect to any flaws present in the test object.

REFERENCES:
patent: 3949210 (1976-04-01), Eichinger et al.
patent: 4090074 (1978-05-01), Watt et al.
patent: 4121098 (1978-10-01), Jagoutz et al.
patent: 4423522 (1983-12-01), Harding
patent: 4538290 (1985-08-01), Nakamura
patent: 4608635 (1986-08-01), Osterholm

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