X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1999-01-27
2000-11-21
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 57, G01N 2304
Patent
active
061513814
ABSTRACT:
An inspection system for inspecting an enclosure and its contents using temporally gated sources of penetrating radiation. A first source produces an intermittent first beam having a duration of inactivity while a second sources produces a second beam, which may have an energy spectrum differing from that of the first beam, during the inactivity of the first beam. One detector generates a transmission signal based on penetrating radiation transmitted through the enclosure while a scatter detector generates a scatter signal based on penetrating radiation scattered by the contents of the enclosure. The scatter detector may be gated for non-detection during the pulsing of the transmission beam. A processor derives properties of the contents of the enclosure on the basis of the transmission signal and the scatter signal.
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Grodzins Lee
Swift Roderick D.
American Science and Engineering, Inc.
Porta David P.
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