Goniometer in an x-ray diffraction device

Details Goniometer in an x-ray diffraction device Goniometer in an x-ray diffraction device

1989-01-23

1990-11-20

Fields, Carolyn E.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 79, G01N 2320

Patent

active

049724487

ABSTRACT:
A goniometer in an X-ray diffraction device comprises a sample table rotatably provided about a center axis of a sample for holding a sample, an X-ray source rotatably provided about the center axis of the sample for irrdiating first X-ray onto a sample, and an X-ray detector rotatably provided about the center axis of the sample for detecting second X-rays resulting from the irradiation of the first X-rays, the second X-rays being diffracted X-rays depending upon a sample. The sample table, the X-ray source an the X-ray detector are rotatable independently of one another, and a component to be fixed can be freely selected in accordance with a purpose of measurement and sample attachments employed. As such, various kinds of measuring methods are available to perform X-ray diffraction analysis by a single goniometer.

REFERENCES:
patent: 3870880 (1975-03-01), Meriqoux et al.
patent: 4263510 (1987-04-01), Ciccarelli et al.

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