X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2006-10-17
2008-12-09
Ho, Allen C. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S086000
Reexamination Certificate
active
07463714
ABSTRACT:
A method and system for identifying foreign objection (FOD) in items such as aircraft are disclosed. The item may be imaged using x-ray backscatter before and after work is performed thereon. The image taken before work may be subtracted from the image taken after the work to provide a resultant image. The resultant image may indicate the presence of any FOD. Potential FOD in the resultant image may be checked against a database of known FOD to determine the identity thereof. By finding FOD, the occurrence of catastrophes such as aircraft crashes may be mitigated.
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Edwards Talion
Georgeson Gary
Safai Morteza
Ho Allen C.
MacPherson Kwok & Chen & Heid LLP
The Boeing Company
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