Goniometric device particularly for X-ray or neutron diffractome

Details Goniometric device particularly for X-ray or neutron diffractome Goniometric device particularly for X-ray or neutron diffractome

1985-06-19

1987-04-14

Howell, Janice A.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

250390, 2504421, 378 80, G01N 2320

Patent

active

046584110

ABSTRACT:
A goniometric device particularly for X-ray or neutron diffractometry on monocrystals or any other sample comprises a sample-holder to maintain the monocrystal to be analyzed in the axis of the incident X-ray or neutron beam. Means for driving this sample-holder on itself, about a first axis, and also in rotation about a second axis perpendicular to the first and a third axis perpendicular to the second. The sample-holder is borne by a slave-goniometer comprising a transverse bar made of ferromagnetic material fast with the sample-holder, therefore perpendicular to the first axis of rotation of the sample-holder on itself. The sample-holder is rotatably mounted onto a support forming part of a universal joint mounted on a fixed base and of which the two perpendicular axes correspond respectively to the second and third axes of rotation. Means are provided for creating a magnetic field whose orientation varies in space so that, for each determined orientation of the magnetic field, the ferromagnetic bar and consequently the sample-holder and the monocrystal take this same orientation.

REFERENCES:
patent: 4016420 (1977-04-01), Rieder
patent: 4263510 (1981-04-01), Ciccarelli et al.
"Apparatus Based on Phillips PW 1100 Diffractometer for Crystal-Structure Research at High Pressures", W. Denner and Heinz Schulz, Philips Tech Rev. 38, pp. 246-253, 1978/79, No. 9.
S. Samson, E. Goldish and C. J. Dick, "A Novel Low-Temperature X-ray Goniometer with Closed-Cycle Cooling to about 18K" J. Appl. Cryst. vol. 13, (1980), pp. 425-432.

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