X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1989-05-08
1991-08-13
Westin, Edward P.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 45, 378 53, 378 82, 378 86, 378 57, 378 49, G01N 23223, G01N 2306, G01N 2304, G01N 23201
Patent
active
050402005
ABSTRACT:
The invention relates to an apparatus and method for detecting the presence of an element of interest within an object. The object is positioned where a beam gamma rays of the required energy are directed to be scattered by the element of interest. The gamma rays are provided by excited atoms of the element of interest. The excited atoms result from the reaction of hydrogen or heavier ions and a suitable target. The excited atoms deexcite releasing gamma rays which are scattered by the element of interest within the object. The scattered gamma rays are detected, output signals are produced, processed and analyzed to determine the amount of the element of interest within the object. A preferred embodiment relates to the detection of nitrogen-based explosives in luggage.
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Brondo, Jr. Joseph H.
Ettinger Kamil V.
Scientific Innovations, Inc.
Westin Edward P.
Wong Don
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