Examination method for the evaluation of location-dependent spec

Details Examination method for the evaluation of location-dependent spec Examination method for the evaluation of location-dependent spec

1994-09-13

1998-09-22

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 57, G01T 136

Patent

active

058126309

ABSTRACT:
The invention relates to an examination method whereby a respective spectrum with a number of spectral values is measured for a number of locations. Collective evaluation of the old spectra is enabled by the following steps:

REFERENCES:
patent: 5467404 (1995-11-01), Vuylsteke et al.
Gianelli et al., "Multichannel Imaging Spectrophotometer for Direct Analysis of Mixtures on Thin-Layer Chromatography Plates", Analytical Chemistry, vol. 55, Oct. 1983, No. 12, pp. 1858-1862.
Kalivas, "Assessing Spectral Orthogonality", Applied Spectroscopy Reveiws, 25 (1989) Sep./Dec., Nos. 3/4, pp. 229-259.
W.H. Press et al, "Numerical Recipes, The Art of Scientifie Computing", pp. 52-65. No Date.
G.A. Golub et al, "Matrix Computations", 1983, pp. 16-21.

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