Examination method and apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Reexamination Certificate

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C378S156000

Reexamination Certificate

active

07006597

ABSTRACT:
A method for examination of a subject comprises the steps of: administering (32) a contrast-enhancing agent into a subject (7, 42) to be examined, the contrast-enhancing agent introducing density variations in the subject; directing (33) ionizing radiation (3) towards the subject; and detecting (34) ionizing radiation spatially resolved as transmitted through the subject, while Compton scattered radiation (3a, 3c) in the subject is essentially prevented from being detected. The ionizing radiation directed towards the subject is provided within a spectral range so that more photons of the ionizing radiation are Compton scattered than absorbed through the photoelectric effect in the subject to thereby detect the density variations introduced by the contrast-enhancing agent in the subject spatially resolved.

REFERENCES:
patent: 4536790 (1985-08-01), Kruger et al.
patent: 4634868 (1987-01-01), DeLacy
patent: 5236693 (1993-08-01), Lee
patent: 5567415 (1996-10-01), Porter
patent: 5772984 (1998-06-01), Berg et al.
patent: 6118125 (2000-09-01), Francke et al.
patent: 6337482 (2002-01-01), Francke
patent: 6373065 (2002-04-01), Francke et al.
patent: 6375931 (2002-04-01), Eriksen et al.
patent: 6385282 (2002-05-01), Francke et al.
patent: 6409671 (2002-06-01), Eriksen et al.
patent: 6414317 (2002-07-01), Francke et al.
patent: 6476397 (2002-11-01), Francke et al.
patent: 6477223 (2002-11-01), Francke
patent: 6518578 (2003-02-01), Francke et al.
patent: 6522722 (2003-02-01), Francke
patent: 6546070 (2003-04-01), Francke
patent: 6547738 (2003-04-01), Lysyansky
patent: 6556650 (2003-04-01), Francke
patent: 6595925 (2003-07-01), Eriksen et al.
patent: 6600804 (2003-07-01), Francke et al.
patent: 6627897 (2003-09-01), Francke et al.
patent: 6645147 (2003-11-01), Jackson et al.
patent: 6856669 (2005-02-01), Francke et al.
patent: 0782375 (1997-07-01), None

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