X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2006-02-28
2006-02-28
Glick, Edward J. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S156000
Reexamination Certificate
active
07006597
ABSTRACT:
A method for examination of a subject comprises the steps of: administering (32) a contrast-enhancing agent into a subject (7, 42) to be examined, the contrast-enhancing agent introducing density variations in the subject; directing (33) ionizing radiation (3) towards the subject; and detecting (34) ionizing radiation spatially resolved as transmitted through the subject, while Compton scattered radiation (3a, 3c) in the subject is essentially prevented from being detected. The ionizing radiation directed towards the subject is provided within a spectral range so that more photons of the ionizing radiation are Compton scattered than absorbed through the photoelectric effect in the subject to thereby detect the density variations introduced by the contrast-enhancing agent in the subject spatially resolved.
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Glick Edward J.
Harness & Dickey & Pierce P.L.C.
Thomas Courtney
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