LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application,Diffraction, reflection, or scattering analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System and methods for characterizing a substance

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System and methods for x-ray backscatter reverse engineering...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System for analyzing metal impurity on the surface of a single c

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System for local X-ray excitation by monochromatic X-rays

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System for making an on-line determination of degree of alloying

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System for radiographically inspecting an object using backscatt

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Systems and methods for detecting an image of an object by...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Systems and methods for x-ray imaging and scanning of objects

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Technique for attentuating x-rays with very low spectral distort

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Thickness measurement gauge

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Thickness measurement with automatic correction for changes in c

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Three dimensional imaging system using laser generated ultrashor

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Three-dimensional imaging system using laser generated ultrashor

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Tomographic imaging with concentric conical collimator

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Tomographic inspection system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Tomographic method of x-ray imaging

Reissue Patent

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Tomographic method of x-ray imaging

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Total reflection X-ray diffraction micrographic method and appar

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Transmission mode X-ray diffraction screening system