Thickness measurement with automatic correction for changes in c

Details Thickness measurement with automatic correction for changes in c Thickness measurement with automatic correction for changes in c

1986-10-10

1989-02-07

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 89, G01B 1502

Patent

active

048037150

ABSTRACT:
An apparatus for measuring the thickness of a sheet of metal by irradiating the sheet with x-rays. The intensity of the initial x-rays, the transmitted x-rays, and the backscattered x-rays are detected and the detector signals are processed to produce a signal representing the thickness of the metal sheet.

REFERENCES:
patent: 3046402 (1962-07-01), Cherry
patent: 3766383 (1973-10-01), Harris et al.
patent: 4007373 (1977-02-01), Torguet et al.
patent: 4047029 (1977-09-01), Allport
patent: 4088886 (1978-05-01), Moulton
patent: 4182954 (1980-01-01), Giles
patent: 4228351 (1980-10-01), Snow et al.

Affiliated with

Also associated with

Rating

Thickness measurement with automatic correction for changes in c does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Thickness measurement with automatic correction for changes in c, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thickness measurement with automatic correction for changes in c will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1089771