X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1996-04-23
1997-09-09
Wong, Don
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 87, G01B 1502
Patent
active
056663943
ABSTRACT:
A thickness measurement gauge for measuring the thickness of an object. The gauge has a closed housing having a radiation-permeable housing floor. Within the housing are disposed (1) a radiation shield that houses a radiation source; (2) a radiation detector for detecting backscatter rays; and (3) a light sensor optically coupled to the radiation detector through a light guide also disposed within the housing. The shield has a collimation channel within which is the radiation source emitting gamma rays that exit the channel as a collimated beam. The light sensor converts light pulses from the radiation detector to electronic signals that are transmitted to an electronic readout device for conversion into a reportable thickness measurement. Measurement is accomplished by positioning the housing floor adjacent the surface of an object to be measured such that the gamma rays passing through the floor enter entry into the object. Resultant backscattered rays are detected by the radiation detector, ultimately resulting in correlation to known thickness values to thereby reveal the thickness of the measured object.
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Anderson Terry J.
Hoch Jr. Karl J.
Northrop Grumman Corporation
Wong Don
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