X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1994-08-04
1997-02-11
Wong, Don
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 4, 378 86, 378901, G01N 23201
Patent
active
056028946
ABSTRACT:
An apparatus for imaging the interior of an object illuminates the object with a source of picosecond collimated x-ray pulses. An array of x-ray detectors senses pulses of Compton scattered x-rays from the object and a processor accumulates the data to construct an image of the object by accumulating data from ellipsoidal sections of the object.
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