X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1998-12-22
2000-09-26
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378159, 378207, G01N 23201
Patent
active
061251658
ABSTRACT:
A method for attenuating x-rays which is insensitive to the x-ray energy employs forward scattering through a filter element to minimize energy shifts due to Compton scattering. Efficiency can be enhanced by employing a material with a large small angle scattering cross section. Since attenuation in the filter increases rapidly with decreasing x-ray energy, the filter provides larger, thinner scattering areas for low energy x-rays and smaller, thicker scattering areas for higher energy x-rays. By adjusting the relative fractions of the scattering areas and their thicknesses, the total scattering yield through the filter can be made to be essentially independent of x-ray energy over a broad band of x-ray energies.
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Oltman Edward
Warburton William K.
Porta David P.
Warburton William K.
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