LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application,Diffraction, reflection, or scattering analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray monitoring system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray monochromator

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray monochromator and spectral measurement apparatus using the

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray multi-layer mirror and x-ray exposure apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray optical device and multilayer mirror for small angle...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray optical element

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray optical element and diffractometer with a soller slit

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray optical element and method for its manufacture

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray optical element including a multilayer coating

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray optical system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray optical system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray optical system and method for imaging a source

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray optical system with adjustable convergence

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray optical system with wobble device

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray optics, especially for phase contrast

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray optics, especially for phase contrast imaging

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray quanta measuring device including diaphragm for producing

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray reflectance measurement system with adjustable resolution

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray reflecting device