X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1989-09-22
1991-04-16
Westin, Edward P.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 88, 378147, 378149, G01N 23201
Patent
active
050089110
ABSTRACT:
A device for measuring the pulse transfer of X-ray quanta which are elastically scattered in an examination zone, includes an X-ray source which is arranged on one side of the examination zone, a detector which is situated on the other side of the examination zone and which measures the energy of the X-ray quanta, and a rotationally-symmetrical diaphragm device which is arranged between the detector and the X-ray source. In a device of this kind a comparatively accurate determination of the pulse transfer is also possible for thick objects, because the diaphragm device is constructed so that the X-ray quanta emitted by the X-ray beam source are transmitted to the examination zone only on the envelope of a cone.
REFERENCES:
patent: 3903415 (1975-09-01), Holzapfel
patent: 4466113 (1984-08-01), Strecker
patent: 4751722 (1988-06-01), Harding et al.
patent: 4754469 (1988-06-01), Harding
patent: 4825454 (1989-04-01), Annis et al.
Chu Kim-Kwok
Squire William
U.S. Philips Corporation
Westin Edward P.
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