X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1994-03-22
1995-06-27
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 88, 378 90, G01N 23201
Patent
active
054286573
ABSTRACT:
The invention is a method and apparatus for identifying and pinpointing the location of unwanted pieces of material or defects in, for example, de-boned poultry pieces. The poultry pieces to be inspected are carried on a conveyor and passed under an impinging collimated X-ray beam. The Rayleigh scattering resulting is detected and measured, as is the Compton back scattering and the data is processed in a processing unit to determine the location and type of foreign matter involved. The ratio of the Rayleigh and Compton scattering is also determined and used to verify the identity of the foreign material. Transmitted X-rays, i.e., radioscopy, are used to normalize the data, and to aid in a pinpointing of the location of the unwanted material.
REFERENCES:
patent: 3375369 (1968-03-01), Goldman et al.
patent: 3710104 (1973-01-01), Pavlik
patent: 3749910 (1973-07-01), Carr-Brian et al.
patent: 3944822 (1976-03-01), Dzubay
patent: 4081676 (1978-03-01), Backman
patent: 4486894 (1984-12-01), Page et al.
patent: 4799247 (1989-01-01), Annis et al.
patent: 4817122 (1989-03-01), Badono et al.
patent: 4870671 (1989-09-01), Hershyn
patent: 4916719 (1990-04-01), Kawatra et al.
patent: 4959848 (1990-09-01), Parobek
patent: 4974247 (1990-11-01), Friddell
patent: 5020084 (1991-05-01), Robertson
patent: 5029337 (1991-07-01), MacKenzie et al.
patent: 5040200 (1991-08-01), Ettinger et al.
patent: 5280513 (1994-01-01), Meltzer
Daley Wayne D. R.
Owens William R.
Papanicolopoulos Chris D.
Wyvill J. Craig
Georgia Tech Research Corporation
Porta David P.
LandOfFree
X-ray monitoring system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with X-ray monitoring system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-ray monitoring system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-293080